Mapping Subsurface Composition with Attogram Sensitivity using Micro-XRF
نویسندگان
چکیده
منابع مشابه
High Sensitivity Subsurface Elemental Composition Measurements with Ping
A. M. Parsons, L. G. Evans, S. Karunatillake, T. P. McClanahan, J. E. Moersch, S. F. Nowicki, J. S. Schweitzer, R. D. Starr, S. Squyres and G.J. Taylor NASA Goddard Space Flight Center, Code 691, Greenbelt, MD 20771, [email protected], Computer Sciences Corporation, Lanham, MD 20706, Louisiana State University, Baton Rouge, LA 70803, University of Tennessee, Knoxville, TN 37996, Universiti...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2018
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927618005779